GRIGORIEV, F.; SULIMOV, V.; TIKHONRAVOV, A. Surface roughness of thin film atomistic nanometer-size clusters. Numerical Methods and Programming (Vychislitel’nye Metody i Programmirovanie), [S. l.], v. 17, n. 50, p. 455–459, 2016. DOI: 10.26089/NumMet.v17r442. Disponível em: https://en.num-meth.ru/index.php/journal/article/view/905. Acesso em: 29 apr. 2024.