Stabilization of computational algorithms for the characterization of thin film coatings

Authors

  • A.V. Tikhonravov
  • M.K. Trubetskov

Keywords:

многослойные покрытия
разработка тонкопленочных оптических покрытий
вычислительное производство
тонкие пленки
стабилизация Key words multilayer coatings
coating design and characterization
computation manufacturing
thin films
stabilization

Abstract

Development of stable computational algorithms for the on-line characterization of thin film optical coatings is a key to the success of their application in many challenging technological areas. This paper presents a general idea that enables one to develop computationally effective and stable characterization algorithms for practically all modern production environments used for optical coating manufacturing. The efficiency of one of such algorithms is demonstrated using a new research methodology called computational manufacturing.

New computational technologies

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Published

2005-04-25

Issue

Vol. 6 (2005): Issue 1.

Section

Section 1. Numerical methods and applications

Author Biographies

A.V. Tikhonravov

Lomonosov Moscow State University,
Research Computing Center

M.K. Trubetskov

Lomonosov Moscow State University,
Research Computing Center

References

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